Advanced Calculations for Defects in Materials (Electronic Structure Methods) || SiO2 in Density Functional Theory and Beyond
Alkauskas, Audrius, Deák, Peter, Neugebauer, Jörg, Pasquarello, Alfredo, Van de Walle, Chris G.Volume:
10.1002/97
Year:
2011
Language:
english
DOI:
10.1002/9783527638529.ch12
File:
PDF, 182 KB
english, 2011