Advanced Calculations for Defects in Materials (Electronic...

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Advanced Calculations for Defects in Materials (Electronic Structure Methods) || SiO2 in Density Functional Theory and Beyond

Alkauskas, Audrius, Deák, Peter, Neugebauer, Jörg, Pasquarello, Alfredo, Van de Walle, Chris G.
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Volume:
10.1002/97
Year:
2011
Language:
english
DOI:
10.1002/9783527638529.ch12
File:
PDF, 182 KB
english, 2011
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