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Macroscopic damage modeling for silicon nitride
Ruck, Johannes, Othmani, Yamen, Lube, Tanja, Khader, Iyas, Kailer, Andreas, Böhlke, ThomasVolume:
15
Language:
english
Journal:
PAMM
DOI:
10.1002/pamm.201510064
Date:
October, 2015
File:
PDF, 420 KB
english, 2015