Defect-enabled electrical current leakage in ultraviolet...

Defect-enabled electrical current leakage in ultraviolet light-emitting diodes (Phys. Status Solidi A 4∕2015)

Moseley, Michael W., Allerman, Andrew A., Crawford, Mary H., Wierer, Jonathan J., Smith, Michael L., Biedermann, Laura B.
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Volume:
212
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201570422
Date:
April, 2015
File:
PDF, 222 KB
2015
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