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[IEEE 2015 2nd Asia-Pacific World Congress on Computer Science and Engineering (APWC on CSE) - Nadi, Fiji (2015.12.2-2015.12.4)] 2015 2nd Asia-Pacific World Congress on Computer Science and Engineering (APWC on CSE) - Shop area visit ratio, stay time, and sales outcomes: In-depth analysis based on RFID data
Li, Zhen, Ishibashi, Ken, Takai, Keiji, Yada, KatsutoshiYear:
2015
Language:
english
DOI:
10.1109/apwccse.2015.7476231
File:
PDF, 824 KB
english, 2015