Accurate measurement of thickness of large-area graphene layers by neutron reflectometry
Jang, Young Rae, Kim, Ki Yeon, Yoo, Keon HoVolume:
51
Language:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-016-0232-x
Date:
November, 2016
File:
PDF, 1.42 MB
english, 2016