Proton Exchange Reactions in SiOx-Based Resistive Switching...

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Proton Exchange Reactions in SiOx-Based Resistive Switching Memory: Review and Insights from Impedance Spectroscopy

Chang, Yao-Feng, Fowler, Burt, Chen, Ying-Chen, Lee, Jack C.
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Language:
english
Journal:
Progress in Solid State Chemistry
DOI:
10.1016/j.progsolidstchem.2016.07.001
Date:
July, 2016
File:
PDF, 3.59 MB
english, 2016
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