[IEEE 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2016.4.25-2016.4.27)] 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - 28nm ultra-low power near-/sub-threshold first-in-first-out (FIFO) memory for multi-bio-signal sensing platforms

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