Influence of RF power on structural optical and electrical properties of hydrogenated nano-crystalline silicon (nc-Si:H) thin films deposited by PE-CVD
Jadhavar, Ashok, Pawbake, Amit, Waykar, Ravindra, Waman, Vaishali, Rondiya, Sachin, Shinde, Omkar, Kulkarni, Rupali, Rokade, Avinash, Bhorde, Ajinkya, Funde, Adinath, Patil, Dinkar, Pathan, Habib, JadVolume:
27
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-016-5024-1
Date:
December, 2016
File:
PDF, 1.24 MB
english, 2016