Patent Quality and Research Productivity: Measuring...

Patent Quality and Research Productivity: Measuring Innovation with Multiple Indicators

Jean O. Lanjouw and Mark Schankerman
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Volume:
114
Language:
english
Journal:
The Economic Journal
DOI:
10.2307/3590103
Date:
April, 2004
File:
PDF, 2.81 MB
english, 2004
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