[IEEE 2016 IEEE International Memory Workshop (IMW) - Paris, France (2016.5.15-2016.5.18)] 2016 IEEE 8th International Memory Workshop (IMW) - Endurance/Retention Trade Off in HfOx and TaOx Based RRAM
Azzaz, M., Vianello, E., Sklenard, B., Blaise, P., Roule, A., Sabbione, C., Bernasconi, S., Charpin, C., Cagli, C., Jalaguier, E., Jeannot, S., Denorme, S., Candelier, P., Yu, M., Nistor, L., FenouillYear:
2016
Language:
english
DOI:
10.1109/imw.2016.7495268
File:
PDF, 3.94 MB
english, 2016