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Combined Parametric and Worst Case Circuit Analysis via Taylor Models
Trinchero, Riccardo, Manfredi, Paolo, Ding, Tongyu, Stievano, Igor S.Volume:
63
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2016.2546389
Date:
July, 2016
File:
PDF, 1.21 MB
english, 2016