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Surface microstructure characterization on shot peened (TiB + TiC)/Ti–6Al–4V by Rietveld whole pattern fitting method
Xie, Lechun, Feng, Qiang, Wen, Yan, Wang, Liqiang, Jiang, Chuanhai, Lu, WeijieLanguage:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2016.256
Date:
July, 2016
File:
PDF, 715 KB
english, 2016