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A New Approach for Modeling Inconsistencies in Digital-Assisted Analog Design
Uygur, Gürkan, Sattler, Sebastian M.Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5600-6
Date:
August, 2016
File:
PDF, 3.45 MB
english, 2016