Measurement uncertainty limit analysis of biased estimators...

IET Science Measurement & Technology 2016 / 08 Vol. 10; Iss. 5

Measurement uncertainty limit analysis of biased estimators in RFID multiple tags system

Yu, Xiaolei, Yu, Yinshan, Wang, Donghua, Zhao, Zhimin, Liu, Jialing
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Volume:
10
Language:
english
Journal:
IET Science, Measurement & Technology
DOI:
10.1049/iet-smt.2015.0202
Date:
August, 2016
File:
PDF, 572 KB
english, 2016
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