Using Accelerated Life Tests Results to Predict Product...

Technometrics 2009 / 05 Vol. 51; Iss. 2

Using Accelerated Life Tests Results to Predict Product Field Reliability

William Q. Meeker, Luis A. Escobar and Yili Hong
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Volume:
51
Language:
english
Journal:
Technometrics
DOI:
10.2307/40586592
Date:
May, 2009
File:
PDF, 1.94 MB
english, 2009
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