Tied factors analysis for high-dimensional image feature...

Pattern Analysis and Applications 2017 / 5 Vol. 20; Iss. 2

Tied factors analysis for high-dimensional image feature extraction and recognition application

Liao, Haibin, Chen, Youbin, Dai, Wenhua, Ruan, Ruolin
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Volume:
20
Language:
english
Journal:
Pattern Analysis and Applications
DOI:
10.1007/s10044-016-0572-9
Date:
May, 2017
File:
PDF, 768 KB
english, 2017
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