Capacitance-voltage spectroscopy and analysis of dielectric...

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Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films

Gerke, Sebastian, Micard, Gabriel, Job, Reinhart, Hahn, Giso, Terheiden, Barbara
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Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201600019
Date:
July, 2016
File:
PDF, 351 KB
english, 2016
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