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Microstructural Characterization and Electrical Properties of Ti–GaSb Junctions
Lin, Kun-Lin, Chen, Szu-HungVolume:
45
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-016-4840-7
Date:
November, 2016
File:
PDF, 3.31 MB
english, 2016