Investigation of reliability analysis algorithms for effective reliability-based optimal design of electromagnetic devices
Ren, Ziyan, Zhang, Dianhai, Koh, Chang-SeopVolume:
10
Language:
english
Journal:
IET Science, Measurement & Technology
DOI:
10.1049/iet-smt.2014.0368
Date:
January, 2016
File:
PDF, 340 KB
english, 2016