![](/img/cover-not-exists.png)
[IEEE 2016 MIXDES - 23rd International Conference "Mixed Design of Integrated Circuits and Systems" - Lodz, Poland (2016.6.23-2016.6.25)] 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems - Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process
Tscherkaschin, Konstantin, Hillebrand, Theodor, Taddiken, Maike, Paul, Steffen, Peters-Drolshagen, DagmarYear:
2016
Language:
english
DOI:
10.1109/MIXDES.2016.7529764
File:
PDF, 1.99 MB
english, 2016