SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - A novel method to measure wheelset parameters based on laser displacement sensor on line
Zhang, Zhi-feng, Harding, Kevin, Huang, Peisen S., Su, Yu-ling, Gao, Zhan, Yoshizawa, Toru, Wang, Guang-yan, Ren, Yu-fen, Jiang, Feng-chunVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.869408
File:
PDF, 286 KB
english, 2010