[IEEE 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) - Successive approximation time-to-digital converter with vernier-level resolution
Jiang, Richen, Li, Congbing, Yang, Mingcong, Kobayashi, Haruo, Ozawa, Yuki, Tsukiji, Nobukazu, Hirano, Mayu, Shiota, Ryoji, Hatayama, KazumiYear:
2016
Language:
english
DOI:
10.1109/IMS3TW.2016.7524226
File:
PDF, 2.97 MB
english, 2016