[IEEE 2016 Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC) - Cairo, Egypt (2016.5.31-2016.6.2)] 2016 Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC) - Fully automated approach for patterned fabric defect detection
Hamdi, Azhar A., Sayed, Mohammed S., Fouad, Mohamed M., Hadhoud, Mohiy M.Year:
2016
DOI:
10.1109/JEC-ECC.2016.7518965
File:
PDF, 299 KB
2016