The Faults Diagnostic Analysis for Analog Circuit Based on...

Journal of Electronic Testing 2016 / 8 Vol. 32; Iss. 4

The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM

Yu, WenXin, Sui, Yongbo, Wang, Junnian
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Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5597-x
Date:
August, 2016
File:
PDF, 730 KB
english, 2016
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