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[IEEE 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2016.4.25-2016.4.27)] 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - SERL: Soft error resilient latch design
Chang, Chun-Wei Jacky, Huang, Hsuan-Ming Ryan, Lin, Yuwen, Wen, Charles H.-P.Year:
2016
Language:
english
DOI:
10.1109/vlsi-dat.2016.7482555
File:
PDF, 161 KB
english, 2016