[ACM Press the 22nd ACM SIGKDD International Conference - San Francisco, California, USA (2016.08.13-2016.08.17)] Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining - KDD '16 - Algorithmic Bias
Hajian, Sara, Bonchi, Francesco, Castillo, CarlosYear:
2016
Language:
english
DOI:
10.1145/2939672.2945386
File:
PDF, 762 KB
english, 2016