Read static noise margin aging model considering SBD and...

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Read static noise margin aging model considering SBD and BTI effects for FinFET SRAMs

Mehrabi, Kolsoom, Ebrahimi, Behzad, Yarmand, Roohollah, Afzali-Kusha, Ali, Mahmoodi, Hamid
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.003
Date:
July, 2016
File:
PDF, 1.92 MB
english, 2016
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