Image analysis of single event transient effects on charge...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2016 / 10 Vol. 834

Image analysis of single event transient effects on charge coupled devices irradiated by protons

Wang, Zujun, Xue, Yuanyuan, Liu, Jing, He, Baoping, Yao, Zhibin, Ma, Wuying
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Volume:
834
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2016.07.046
Date:
October, 2016
File:
PDF, 681 KB
english, 2016
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