A study of the migration loss in glass and a generalized method of calculating the rise of dielectric loss with temperature
Isard, J.O.Volume:
109
Year:
1962
Language:
english
Journal:
Proceedings of the IEE - Part B: Electronic and Communication Engineering
DOI:
10.1049/pi-b-2.1962.0077
File:
PDF, 1.04 MB
english, 1962