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[IEEE 2016 IEEE/MTT-S International Microwave Symposium - MTT 2016 - San Francisco, CA, USA (2016.5.22-2016.5.27)] 2016 IEEE MTT-S International Microwave Symposium (IMS) - Software-defined reader for multi-modal RFID sensing
Kimionis, John, Tentzeris, Manos M.Year:
2016
Language:
english
DOI:
10.1109/mwsym.2016.7540213
File:
PDF, 512 KB
english, 2016