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[IEEE 2016 IEEE/MTT-S International Microwave Symposium - MTT 2016 - San Francisco, CA, USA (2016.5.22-2016.5.27)] 2016 IEEE MTT-S International Microwave Symposium (IMS) - Non-linear electro-thermal AlGaN/GaN model including large-signal dynamic thermal-trapping effects
Benvegnu, Agostino, Jardel, Olivier, Laurent, Sylvain, Barataud, Denis, Meneghini, Matteo, Zanoni, Enrico, Quere, RaymondYear:
2016
Language:
english
DOI:
10.1109/MWSYM.2016.7540040
File:
PDF, 729 KB
english, 2016