![](/img/cover-not-exists.png)
Impact of oxygen exchange reaction at the ohmic interface in Ta 2 O 5 -based ReRAM devices
Kim, Wonjoo, Menzel, Stephan, Wouters, Dirk J., Guo, Yuzheng, Robertson, John, Roesgen, Bernd, Waser, Rainer, Rana, VikasYear:
2016
Language:
english
Journal:
Nanoscale
DOI:
10.1039/C6NR03810G
File:
PDF, 2.98 MB
english, 2016