Electrical Characterization and Defect-Related Luminescence...

Solid State Phenomena 2015 / 10 Vol. 242

Electrical Characterization and Defect-Related Luminescence in Oxygen Implanted Silicon

Danilov, D.V., Vyvenko, O.F., Sobolev, N.A., Vdovin, V.I., Loshachenko, A.S., Shek, E.I., Aruev, P.N., Zabrodskiy, V.V.
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Volume:
242
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.242.368
Date:
October, 2015
File:
PDF, 1.02 MB
english, 2015
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