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[IEEE 2016 5th International Symposium on Next-Generation Electronics (ISNE) - Hsinchu, Taiwan (2016.5.4-2016.5.6)] 2016 5th International Symposium on Next-Generation Electronics (ISNE) - 3D IC test scheduling with test pads considered
Hsu, Ming-Hsuan, Cheng, Chun-Hua, Huang, Shih-HsuYear:
2016
Language:
english
DOI:
10.1109/ISNE.2016.7543363
File:
PDF, 242 KB
english, 2016