[IEEE 2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Lisbon, Portugal (2016.6.27-2016.6.30)] 2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Reliable design methodology: The combined effect of radiation, variability and temperature
Garcia-Redondo, Fernando, Lopez-Vallejo, Marisa, Aparicio, Hernan, Ituero, PabloYear:
2016
Language:
english
DOI:
10.1109/SMACD.2016.7520646
File:
PDF, 318 KB
english, 2016