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[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - Behavior and test of open-gate defects in FinFET based cells
Mesalles, F., Villacorta, H., Renovell, M., Champac, V.Year:
2016
Language:
english
DOI:
10.1109/ets.2016.7519305
File:
PDF, 1.69 MB
english, 2016