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[IEEE 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Taipei, Taiwan (2016.5.23-2016.5.26)] 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Machine fault classification using deep belief network
Chen, Zhuyun, Zeng, Xueqiong, Li, Weihua, Liao, GuanglanYear:
2016
Language:
english
DOI:
10.1109/i2mtc.2016.7520473
File:
PDF, 212 KB
english, 2016