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Digital sampling Moiré as a substitute for microscope scanning Moiré for high-sensitivity and full-field deformation measurement at micron/nano scales
Wang, Qinghua, Ri, Shien, Tsuda, HiroshiVolume:
55
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.55.006858
Date:
September, 2016
File:
PDF, 1.38 MB
english, 2016