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Study of strained-Si p-channel MOSFETs with HfO2 gate dielectric
Pradhan, Diana, Das, Sanghamitra, Dash, Tara PrasannaLanguage:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2016.08.019
Date:
August, 2016
File:
PDF, 523 KB
english, 2016