[IEEE 2015 16th International Conference on Sciences and Techniques of Automatic Control and Computer Engineering (STA) - Monastir, Tunisia (2015.12.21-2015.12.23)] 2015 16th International Conference on Sciences and Techniques of Automatic Control and Computer Engineering (STA) - Image segmentation for defect detection based on level set active contour combined with saliency map
Ben Gharsallah, Mohamed, Ben Braiek, EzzedineYear:
2015
Language:
english
DOI:
10.1109/STA.2015.7505146
File:
PDF, 1.31 MB
english, 2015