Low-Frequency Noise in Advanced SiGe:C HBTs Part I:...

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IEEE Transactions on Electron Devices 2016

Low-Frequency Noise in Advanced SiGe:C HBTs Part I: Analysis

Mukherjee, Chhandak, Jacquet, Thomas, Chakravorty, Anjan, Zimmer, Thomas, Bock, Josef, Aufinger, Klaus, Maneux, Cristell
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2589159
File:
PDF, 3.33 MB
english, 2016
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