A rapid and automated relocation method of an AFM probe for...

Nanotechnology 2016 / 09 Vol. 27; Iss. 39

A rapid and automated relocation method of an AFM probe for high-resolution imaging

Zhou, Peilin, Yu, Haibo, Shi, Jialin, Jiao, Niandong, Wang, Zhidong, Wang, Yuechao, Liu, Lianqing
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Volume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/39/395705
Date:
September, 2016
File:
PDF, 3.50 MB
english, 2016
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