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Short critical area model and extraction algorithm based on defect characteristics in integrated circuits
Wang, Jun-Ping, Wu, Yao, Zhao, Teng-WeiVolume:
91
Language:
english
Journal:
Analog Integrated Circuits and Signal Processing
DOI:
10.1007/s10470-016-0841-y
Date:
April, 2017
File:
PDF, 1.01 MB
english, 2017