![](/img/cover-not-exists.png)
Bias of shear wave elasticity measurements in thin layer samples and a simple correction strategy
Mo, Jianqiang, Xu, Hao, Qiang, Bo, Giambini, Hugo, Kinnick, Randall, An, Kai-Nan, Chen, Shigao, Luo, ZongpingVolume:
5
Language:
english
Journal:
SpringerPlus
DOI:
10.1186/s40064-016-2937-3
Date:
December, 2016
File:
PDF, 2.04 MB
english, 2016