Imaging of electrical response of NiO x under controlled...

Journal of Photonics for Energy 2016 / 07 Vol. 6; Iss. 3

Imaging of electrical response of NiO x under controlled environment with sub-25-nm resolution

Jacobs, Christopher B., Ievlev, Anton V., Collins, Liam F., Muckley, Eric S., Joshi, Pooran C., Ivanov, Ilia N.
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Volume:
6
Language:
english
Journal:
Journal of Photonics for Energy
DOI:
10.1117/1.jpe.6.038001
Date:
July, 2016
File:
PDF, 3.80 MB
english, 2016
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