Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry
Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, ChantelLanguage:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2016.08.131
Date:
August, 2016
File:
PDF, 1.88 MB
english, 2016