Stability and accuracy control of k · p parameters
Bastos, Carlos M O, Sabino, Fernando P, Junior, Paulo E Faria, Campos, Tiago, Silva, Juarez L F Da, Sipahi, Guilherme MVolume:
31
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/31/10/105002
Date:
October, 2016
File:
PDF, 1.66 MB
english, 2016