[Topics in Applied Physics] Ferroelectric-Gate Field Effect...

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[Topics in Applied Physics] Ferroelectric-Gate Field Effect Transistor Memories Volume 131 ||

Park, Byung-Eun, Ishiwara, Hiroshi, Okuyama, Masanori, Sakai, Shigeki, Yoon, Sung-Min
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Volume:
10.1007/97
Year:
2016
Language:
english
DOI:
10.1007/978-94-024-0841-6
File:
PDF, 17.54 MB
english, 2016
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