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Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification
Sun, Bo, Pan, Wuyang, Wang, Zili, Yung, Kam-ChuenVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.115
Date:
August, 2015
File:
PDF, 1.02 MB
english, 2015