Formation of He-rich layers observed by neutron reflectometry in the He ions irradiated Cr/W multilayers: Effects of Cr/W interfaces on the He trapping behavior
Chen, Feida, Tang, Xiaobin, Huang, Hai, Li, Xinxi, Wang, Yan, Huang, Chaoqiang, Liu, Jian, Li, Huan, Chen, DaLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.6b07419
Date:
September, 2016
File:
PDF, 940 KB
english, 2016